IEC 62276-2005 表面声波装置用单晶薄片.规范和测量方法

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                   【英文标准名称】:     Single crystal wafers for surface acoustic wave (SAW) device application - Specifications and measuring methods            【原文标准名称】:     表面声波装置用单晶薄片.规范和测量方法            【标准号】:     IEC 62276-2005            【标准状态】:     现行            【国别】:     国际            【发布日期】:     2005-05    【实施或试行日期】: 【发布单位】: 国际电工委员会(IX-IEC)【起草单位】: IEC/TC 49【标准类型】: ()【标准水平】: ()【中文主题词】: 电子设备及元件;定义;电气工程;测量方法;规范(验收);频率稳定;规范;表面声波;压电;声波;石英晶体;薄片;单晶;压电器件【英文主题词】: Acoustic waves;Crystal lattices;Crystals (electronic);Definitions;Electrical engineering;Electrical properties;Electrical properties and phenomena;Electronic equipment and components;Finishes;Frequency stabilization;Measuring techniques;Methods for measuringiezoelectric devicesiezoelectricity;Quartz crystals;Ratings;Single crystal;Specification;Specification (approval);Specifications;Surface acoustic wave devices;Surface acoustic waves;Testing;Wafers【摘要】: This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.【中国标准分类号】: L21【国际标准分类号】: 31_140【页数】: 40P.;A4【正文语种】: 英语