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【英文标准名称】: Test specifications for avalanche junction semiconductor surge protective devices 【原文标准名称】: 雪崩结半导体电涌保护器件试验规范 【标准号】: IEEE C 62.35-1987 【标准状态】: 作废 【国别】: 美国 【发布日期】: 1987 【实施或试行日期】: 【发布单位】: 美国电气电子工程师学会(US-IEEE)【起草单位】: IEEE【标准类型】: ()【标准水平】: ()【中文主题词】: 电气工程;规范;半导体;过电压保护;电压保护【英文主题词】: Electrical engineering;Semiconductors;Specification;Surge protection;Voltage protection【摘要】: This standard applies to a two terminal avalanche junction surge suppressor for surge protective application on systemswith dc to 420 Hz frequency and voltages equal to or less than 1000 V rms or 1200 V dc. The avalanche junction surgesuppressor is a semiconductor diode which can operate in either the forward or reverse direction of its V-Icharacteristic. The device is a single package which may be assembled from any combination of series and/or paralleldiode chips. This standard contains definitions, service conditions, and a series of test criteria for determining theelectrical characteristics of these semiconductor avalanche junction surge suppressors. If the characteristics differ withthe direction of conduction, then each direction of conduction shall be separately specified.1 Arresters are covered inANSI/IEEE C62.1-1984 [1] 2,3 and ANSI/IEEE C62.33-1982 [2].【中国标准分类号】: K31【国际标准分类号】: 29_120_50【页数】: 22P.;A4【正文语种】: 英语
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