ISO 23833-2006 微光束分析.电子探针微量分析(EPMA).词汇

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                   【英文标准名称】:     Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary            【原文标准名称】:     微光束分析.电子探针微量分析(EPMA).词汇            【标准号】:     ISO 23833-2006            【标准状态】:     现行            【国别】:     国际            【发布日期】:     2006-12    【实施或试行日期】: 【发布单位】: 国际标准化组织(IX-ISO)【起草单位】: ISO/TC 202【标准类型】: ()【标准水平】: ()【中文主题词】: 分析;分析方法;定义;电子束;法语;分析的方法;微量分析;多语种的;术语;词汇【英文主题词】: Analysis;Analysis methods;Definitions;Electron beams;French language;Methods of analysis;Microanalysis;Multilingual;Terminology;Vocabulary【摘要】: This International Standard defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.This International Standard is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of this International Standard are applicable to those documents relevant to the practices of related fields (e.g. SEM, AEM, EDX) for definition of those terms common to them.【中国标准分类号】: N33;A43【国际标准分类号】: 01_040_71;71_040_50;71_040_99【页数】: 51P;A4【正文语种】: 英语