rinted-circuit boards;Test set-ups;Testing;Testing conditions;Testing devices【摘要】: This measurement procedure describes a measurement method to quantify the RF immunity of integrated circuits (ICs) mounted on a standardized test board or on their final application board (PCB), to electromagnetic conductive disturbances.【中国标准分类号】: L56【国际标准分类号】: 31_200【页数】: 54P.;A4【正文语种】: 英语 | 欢迎光临 世界资料网论坛 (http://bbs.infoeach.com/) | Powered by Discuz! X2.5 |