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标题:
IEC 60749-28-2017 Semiconductor devices – Mechanical and climatic test methods
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作者:
cc523pate
时间:
2018-1-25 21:48:03
标题:
IEC 60749-28-2017 Semiconductor devices – Mechanical and climatic test methods
IEC
60749
-28-2017 Semiconductor devices – Mechanical and climatic test methods – Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – device level
作者:
admin
时间:
2018-1-29 12:00:47
谢谢您的分享,金币已奖励!
作者:
luthary
时间:
2018-5-29 15:25:26
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作者:
ygs67
时间:
2018-5-30 12:27:57
多谢分享!
作者:
fenglau
时间:
2018-5-31 10:18:28
~~~~~~~~~~~~~~分享快乐~~~~~~~~~~~~
作者:
hgundas
时间:
2019-9-30 03:41:32
謝謝樓主的分享!!!!!!
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