标题: IEC 60749-20-2020 Semiconductor devices - Mechanical and climatic test methods - [打印本页] 作者: liuxilin1215 时间: 2021-3-13 15:03:30 标题: IEC 60749-20-2020 Semiconductor devices - Mechanical and climatic test methods -
IEC 60749-20-2020 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat