世界资料网论坛

标题: IEC 60749-21:2011 Semiconductor devices – Mechanical and climatic test methods [打印本页]

作者: hgundas 时间: 2020-4-17 03:28:59 标题: IEC 60749-21:2011 Semiconductor devices – Mechanical and climatic test methods

[attach]223663[/attach]
IEC 60749-21:2011
Semiconductor devices – Mechanical and climatic test methods –
Part 21: Solderability

作者: admin 时间: 2020-4-25 22:48:30

谢谢您的分享，金币已奖励!

欢迎光临世界资料网论坛 (http://bbs.infoeach.com/)