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标题: IEC 60749-27-2012 Semiconductor devices – Mechanical and climatic test methods [打印本页]

作者: shukesan 时间: 2018-1-12 21:35:55 标题: IEC 60749-27-2012 Semiconductor devices – Mechanical and climatic test methods

Semiconductor devices – Mechanical and climatic test methods –Part 27: Electrostatic discharge (ESD) sensitivity testing – Machine model (MM)

作者: admin 时间: 2018-1-15 12:03:35

谢谢您的分享，金币已奖励!

作者: 闲看花开的日子 时间: 2018-2-7 09:54:16

谢谢您的分享！！！！！！

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