MIL-STD-750-4-2012 半导体二极管的电气试验方法
MIL-STD-750-4-2012 DIODE ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 4: TEST METHODS 4000 THROUGH 4999MIL–STD–750–4
3 January 2012
SUPERSEDING
MIL–STD–750E (IN PART)
20 November 2006
(see 6.4)
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