MIL-STD-750-1-2012 半导体器件环境试验方法
MIL-STD-750-1-2012 ENVIRONMENTAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 1: TEST METHODS 1000 THROUGH 1999MIL–STD–750–1
3 January 2012
SUPERSEDING
MIL–STD–750E (IN PART)
20 November 2006
(see 6.4)
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