hgundas 发表于 2020-4-23 21:35:06

IEC 60749-20:2008 Semiconductor devices – Mechanical and climatic test methods



IEC 60749-20:2008
Semiconductor devices – Mechanical and climatic test methods –
Part 20: Resistance of plastic encapsulated SMDs to the combined effect of
moisture and soldering heat

admin 发表于 2020-4-26 09:34:48

谢谢您的分享，金币已奖励!
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