世界资料网论坛's Archiver
论坛首页
›
IEC 国际电工标准
› IEC 60749-21:2011 Semiconductor devices – Mechanical and climatic test methods
hgundas
发表于 2020-4-17 03:28:59
IEC 60749-21:2011 Semiconductor devices – Mechanical and climatic test methods
IEC 60749-21:2011
Semiconductor devices – Mechanical and climatic test methods –
Part 21: Solderability
admin
发表于 2020-4-25 22:48:30
谢谢您的分享,金币已奖励!
页:
[1]
查看完整版本:
IEC 60749-21:2011 Semiconductor devices – Mechanical and climatic test methods