IEC 61189-5-503-2017
本帖最后由 h202226 于 2018-3-12 23:01 编辑IEC 61189-5-503-2017Test methods for electrical materials, printed board and other interconnection
structures and assemblies –
Part 5-503: General test method for materials and assemblies – Conductive
anodic filaments (CAF) testing of circuit boards
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