cc523pate 发表于 2018-1-25 21:48:03

IEC 60749-28-2017 Semiconductor devices – Mechanical and climatic test methods

IEC 60749-28-2017 Semiconductor devices – Mechanical and climatic test methods – Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – device level



admin 发表于 2018-1-29 12:00:47

谢谢您的分享，金币已奖励!

luthary 发表于 2018-5-29 15:25:26

哎，积分不够,攒够了积分再来

ygs67 发表于 2018-5-30 12:27:57

多谢分享！                          

fenglau 发表于 2018-5-31 10:18:28

~~~~~~~~~~~~~~分享快乐~~~~~~~~~~~~:D

hgundas 发表于 2019-9-30 03:41:32


謝謝樓主的分享！！！！！！
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